• DocumentCode
    1074015
  • Title

    On the Mechanism of Aluminum Corrosion in Metallized Film AC Capacitors

  • Author

    Taylor, D.F.

  • Author_Institution
    General Electric Corporate Research and Development Schenectady, New York
  • Issue
    4
  • fYear
    1984
  • Firstpage
    288
  • Lastpage
    293
  • Abstract
    Metallized film capacitors consist of alternating layers of polypropylene or other polymeric film dielectric and vapor deposited aluminum conductor. During operation above 250 V ac (RMS), circular islands of oxide develop in the aluminum conducting layers and reduce the capacitance. Increasing the aluminum layer thickness to more than the normal value of about 30 nm reduces the corrosion problem. The removal of moisture stops corrosion. Corrosion increases with temperature, ac voltage, and frequency to 3.5 kHz. A dc field, equivalent to the peak ac field, cannot initiate or sustain the corrosion process. These observations are consistent with a mechanism of anodic oxidation at the edge of defects in the aluminum layers. These discontinuities in the aluminum must be sufficiently large to enhance the local electric field and sustain ionic transport in the oxide. Fibrils on the polymer-film surface, and both electrical and electrochemical self-healing processes, are the most probable sources of corrosioninitiating conducting-layer defects.
  • Keywords
    Aluminum; Capacitance; Capacitors; Conductive films; Corrosion; Dielectric films; Metallization; Moisture; Polymer films; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/TEI.1984.298801
  • Filename
    4081251