DocumentCode
1074024
Title
Universal Dependence of the Critical Temperature in HTS on the Fractional Volume of Nanosize Defects
Author
Gandini, Alberto ; Weinstein, Roy ; Sawh, Ravi ; Mayes, Billy ; Parks, Drew
Author_Institution
Univ. of Houston, Houston
Volume
17
Issue
2
fYear
2007
fDate
6/1/2007 12:00:00 AM
Firstpage
3692
Lastpage
3696
Abstract
We report on the effect of randomly-distributed amorphous defects, ~ at the length scale of the superconducting coherence length, on Tc in YBCO. These damages were created by ions irradiation with a wide range of energy and fluence. Typically, in previous experiments, Tc was found to vary with ion fluence, species, energy, and ionization charge, and also on the chemical composition and density of the HTS. Neither a phenomenological nor a theoretical relationship between Tc and these ion properties is however known of. We now show that the decrease in Tc is a universal function of the fractional defect volume embedded in the HTS. We also re-analysed several experiments by others, and find that the same universality applies. This finding provides, for the first time, a means to calculate the effect on Tc of disorder as created by randomly-distributed amorphous nanosize defects.
Keywords
barium compounds; coherence length; high-temperature superconductors; ion beam effects; noncrystalline defects; superconducting transition temperature; yttrium compounds; YBa2Cu3O7 - System; chemical composition; fractional defect volume; high temperature superconductors; ion energy; ion fluence; ion irradiation; ion species; ionization charge; randomly-distributed amorphous defects; superconducting coherence length; Amorphous materials; Chemicals; Conductivity; Doping; High temperature superconductors; Ionization; Nuclear electronics; Superconducting materials; Superconductivity; Temperature dependence; $T_{c}$ ; Disorder; irradiation;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2007.898251
Filename
4278097
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