Title :
YBCO microwave grain boundary mixer using a SrTiO3 bicrystal substrate
Author :
Seed, Randall G. ; Dorsey, Paul C. ; How, Hoton ; Widom, Alan ; Vittoria, Carmine
Author_Institution :
Northeastern Univ., Boston, MA, USA
fDate :
11/1/1993 12:00:00 AM
Abstract :
A microwave mixer was patterned on a microstrip transmission line of superconducting YBCO (YBa2Cu3O7-x). The YBCO film was epitaxially laser deposited on a SrTiO3 bicrystal substrate. A weak link was constructed by patterning a microbridge in the microstrip at the bicrystal boundary. Microwave signals at 9.000 GHz and 9.941 GHz were applied at the input of the microstrip line. An output intermediate frequency signal was observed at 941 MHz and was detected as the transmitted signal. The microbridge junction, which behaved as a resistively shunted Josephson junction (RSJ), was current biased slightly above the critical current Ic . The mixer conversion loss was measured at the input and output ports of the device package. The mixing efficiency was determined at the device junction. This efficiency was compared with the calculated efficiency determined by numerical solution of the Josephson equation for the weak link junction
Keywords :
barium compounds; grain boundaries; high-temperature superconductors; microstrip components; mixers (circuits); solid-state microwave circuits; superconducting junction devices; superconducting microwave devices; yttrium compounds; 9.0 GHz; 9.941 GHz; 941 MHz; SrTiO3; SrTiO3 bicrystal substrate; YBCO microwave grain boundary mixer; YBa2Cu3O7; critical current; epitaxy; laser deposition; microbridge; microstrip; microstrip transmission line; microwave mixer; mixer conversion loss; mixing efficiency; output intermediate frequency signal; resistively shunted Josephson junction; weak link; Frequency; Grain boundaries; Masers; Microstrip; Substrates; Superconducting epitaxial layers; Superconducting films; Superconducting microwave devices; Superconducting transmission lines; Yttrium barium copper oxide;
Journal_Title :
Magnetics, IEEE Transactions on
