Title :
Measurement of cathode properties in close-spaced diode testers
Author_Institution :
Avionics Laboratory, Wright-Patterson AFB, OH
fDate :
5/1/1981 12:00:00 AM
Abstract :
The field solution of a plane edge above an infinite plane is used to estimate the errors in reducing data from close-spaced diode testers. For a typical example the edge effects introduce a 66°C error in temperature calculations based on Schottky theory while introducing no significant error in the determination of the zero field current.
Keywords :
Cathodes; Current density; Electrodes; Geometry; Schottky diodes; Space charge; Temperature; Testing; Vehicles; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1981.20388
