DocumentCode
1074162
Title
Measurement of cathode properties in close-spaced diode testers
Author
Scott, Jess B.
Author_Institution
Avionics Laboratory, Wright-Patterson AFB, OH
Volume
28
Issue
5
fYear
1981
fDate
5/1/1981 12:00:00 AM
Firstpage
593
Lastpage
595
Abstract
The field solution of a plane edge above an infinite plane is used to estimate the errors in reducing data from close-spaced diode testers. For a typical example the edge effects introduce a 66°C error in temperature calculations based on Schottky theory while introducing no significant error in the determination of the zero field current.
Keywords
Cathodes; Current density; Electrodes; Geometry; Schottky diodes; Space charge; Temperature; Testing; Vehicles; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1981.20388
Filename
1481540
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