DocumentCode :
1074171
Title :
The derivation of a relationship for the charge-control base lifetime in terms of the base and collector small-signal conductances
Author :
Heasell, E.L.
Author_Institution :
University of Waterloo, Waterloo, Ontario, Canada
Volume :
28
Issue :
5
fYear :
1981
fDate :
5/1/1981 12:00:00 AM
Firstpage :
595
Lastpage :
596
Abstract :
We derive an expression for the average base recombination time τB. The lifetime may be evaluated from measurements of the collector and base conductance at moderate frequencies. The derivation corrects an error in earlier work [4].
Keywords :
Electrons; Equations; Error correction; Frequency measurement; Impurities; Ionization; Statistics; Time measurement; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1981.20389
Filename :
1481541
Link To Document :
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