DocumentCode :
1074385
Title :
Optoelectronic Measurement of Partial Arcs on a Contaminated Surface
Author :
Matsumoto, T. ; Ishii, M. ; Kawamura, T.
Author_Institution :
Dept. of Electical Eng. Shizuoka University3-5-1, Johoku, Hamamatsu Shizuoka 432, Japan
Issue :
6
fYear :
1984
Firstpage :
543
Lastpage :
549
Abstract :
In this paper, characteristics of a partial arc on a contaminated surface containing NaCl, measured by optoelectronic techniques, are described. Streak photographs using a solid state image sensing device clarified propagation characteristics and temporal variations of the diameter of a partial arc. A spectroscopic measurement revealed that most of the light emitted from the arc consists of the Na spectrum, and the temperature of the arc column is lower than that of a free-air arc. The calculated results on physical characteristics of the partial arc are discussed together with the experimental results.
Keywords :
Integrated circuit measurements; Lenses; Optical propagation; Pollution measurement; Solid state circuits; Spectroscopy; Surface contamination; Temperature sensors; Velocity measurement; Voltage;
fLanguage :
English
Journal_Title :
Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9367
Type :
jour
DOI :
10.1109/TEI.1984.298827
Filename :
4081292
Link To Document :
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