DocumentCode :
1074474
Title :
Experimental observation of solute segregation in longitudinal CoPtCr/Cr magnetic thin films
Author :
Kim, Myong R. ; Guruswamy, Sivaraman ; Johnson, Kenneth E.
Author_Institution :
Dept. of Metall. Eng., Utah Univ., Salt Lake City, UT, USA
Volume :
29
Issue :
6
fYear :
1993
fDate :
11/1/1993 12:00:00 AM
Firstpage :
3673
Lastpage :
3675
Abstract :
The gain boundary structure and elemental segregation in longitudinal Co75Pt12Cr13/Cr magnetic thin film media were investigated by using high resolution transmission electron microscopy and nanoprobe X-ray chemical analysis. The study provides experimental evidence for the segregation of Cr and possibly Pt along the high-angle grain boundaries of Co-alloy grains. The maximum extents of Cr and Pt segregation are reported in terms of Cr/Co peak ratios measured at four grain interior locations and five grain boundary locations. The average Cr/Co peak ratios were 1.35±0.64 for the grain boundary and 0.51±0.16 for the grain interior. The average Pt/Co peak ratios were 1.10±0.22 for the grain boundary and 0.95±0.14 for the grain interior. As the extended excitation region and the electron beam broadening during transmission are larger than the boundary width, the actual segregation will be even higher than the values shown here
Keywords :
X-ray chemical analysis; chromium; chromium alloys; cobalt alloys; ferromagnetic properties of substances; grain boundaries; magnetic recording; magnetic thin films; platinum alloys; segregation; sputtered coatings; transmission electron microscope examination of materials; Co75Pt12Cr13-Cr magnetic thin film; electron beam broadening; elemental segregation; gain boundary structure; high resolution transmission electron microscopy; longitudinal thin films; magnetic recording; nanoprobe X-ray chemical analysis; solute segregation; sputter deposition; Chemical analysis; Chemical elements; Chromium; Grain boundaries; Magnetic films; Magnetic force microscopy; Magnetic noise; Magnetic separation; Sputtering; Transmission electron microscopy;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.281265
Filename :
281265
Link To Document :
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