DocumentCode :
1074668
Title :
Effects of Conditioning on Life and Reliability of Capacitors
Author :
Starr, Wendell T. ; Hogue, Lawrence J.
Author_Institution :
General Electric Corp., Philadelphia, Pa.
Issue :
2
fYear :
1967
Firstpage :
102
Lastpage :
107
Abstract :
The results of a study of the life behavior of a developmental capacitor of the synthetic film type are presented. The life is shown to be extremely sensitive to thermal history of the capacitor. Heating at 85°C for 100 days increased the life by at least 40 to 1. Progressive stress testing in which voltage is increased with time aided materially in defining this effect as well as in showing that two mechanisms of failure were present. The purpose in this presentation is to present an example of the conditioning effect because it is not generally recognized that its effect on life can be as serious as it often is.
Keywords :
Capacitors; Dielectrics; Heating; History; Life testing; Materials testing; Moisture; Temperature; Thermal stresses; Voltage;
fLanguage :
English
Journal_Title :
Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9367
Type :
jour
DOI :
10.1109/TEI.1967.298837
Filename :
4081323
Link To Document :
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