Title :
Interactions in CoPtCr/SiO2 composite thin films
Author :
El-Hilo, M. ; O´Grady, K. ; Nguyen, T.A. ; Baumgart, P. ; Sanders, I.L.
Author_Institution :
SEECS, Univ. Coll. of North Wales, Bangor, UK
fDate :
11/1/1993 12:00:00 AM
Abstract :
The behavior of CoPtCr/SiO2 composite thin films with variable percentages of SiO2 (0%→35%) is reported. From measurements of remanence curves and interaction characterization via the delta plot curves, films with 20%→24% SiO2 shows a wider range of switching fields and lower magnitude of interaction in comparison with the films containing a lower concentration of SiO2
Keywords :
chromium alloys; cobalt alloys; coercive force; exchange interactions (electron); ferromagnetic properties of substances; magnetic hysteresis; magnetic switching; magnetic thin films; platinum alloys; remanence; silicon compounds; sputtered coatings; CoPtCr-SiO2; CoPtCr/SiO2 composite thin films; coercivity; cooperative switching; delta plot curves; exchange coupled grains; interaction characterization; magnetic thin films; remanence curves; squareness co-sputtered; switching fields; Coercive force; Energy barrier; Magnetic separation; Magnetic susceptibility; Magnetization; Remanence; Shape; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
