Title :
True direct overwrite in single layer magneto-optic recording
Author :
Schultz, Mark D. ; Kryder, Mark H. ; Sekiya, M. ; Chiba, K.
fDate :
11/1/1993 12:00:00 AM
Abstract :
Single layer direct overwrite materials were investigated with the goal of improving the carrier-to-noise ratio (CNR) of these films. Both experimental and modeling studies of the dynamics of direct overwrite without defined bit positions were combined with the study of a large matrix of material samples to provide guided material improvements. Experimental study included magnetic measurements, CNR measurements, and observation of magnetization and thermal dynamics with stroboscopic polarized light microscopy. Thermal modeling was used to gain further insight into the thermal dynamics of direct overwrite. The results showed that flat substrates, high disc velocities, and materials which by means of sputter-etching the underlayer exhibit smooth wall motion can combine to produce true multifrequency direct overwrite with CNRs of 42 dB or better
Keywords :
magnetic domain walls; magnetisation; magneto-optical recording; noise; CNR; direct overwrite materials; dynamics of direct overwrite; flat substrates; high disc velocities; magnetization dynamics; modeling; single layer magneto-optic recording; smooth wall motion; sputter-etching; stroboscopic polarized light microscopy; thermal dynamics; true multifrequency direct overwrite; Data storage systems; Frequency; Magnetic field measurement; Magnetic force microscopy; Magnetic materials; Magnetization; Magnetooptic recording; Power lasers; Pulse measurements; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on