Title :
Raman Scattering Studies of YBa2Cu3O7−x Films Grown by High-Rate e-Beam Co-Evaporation
Author :
Lee, E. ; Yoon, H.R. ; Jo, W. ; Yoon, S. ; Cheong, H. ; Lee, H.G. ; Hong, G.W. ; Huh, J.U. ; Hammond, R.H. ; Beasley, M.R.
Author_Institution :
Ewha Womans Univ., Seoul
fDate :
6/1/2007 12:00:00 AM
Abstract :
We present results of Raman scattering studies of superconducting YBa2Cu3O7-x (YBCO) films grown by a high-rate electron-beam co-evaporation method. It is shown by X-ray diffraction that the as-grown YBCO films have a highly c-axis oriented and in-plane aligned texture. Raman scattering measurements were used to study optical phonon modes, oxygen content and second phases of the YBCO coated conductors. Raman spectra of YBCO films with lower-transport properties exhibit additional phonon modes at ~ 300 cm-1, ~ 600 cm-1, and ~ 630 cm-1, which are related to second-phases such as Ba2Cu3O5.9 and BaCuO2. We also performed micro-Raman scattering measurements, which enable the local characterization of the material over a few micrometer scales. We could clearly determine the chemical homogeneities of the films on which we could not have information using XRD. Our results strongly suggest that micro-Raman scattering can be a very effective tool for characterizing structural and chemical properties, which is essential for optimizing growth conditions.
Keywords :
Raman spectra; X-ray diffraction; barium compounds; electron beam deposition; superconducting thin films; vacuum deposition; yttrium compounds; Raman spectra; X-ray diffraction; XRD; YBa2Cu3O7 - System; c-axis oriented texture; chemical homogeneities; electron-beam co-evaporation; in-plane aligned texture; micro-Raman scattering; optical phonon modes; superconducting films; Chemicals; Optical diffraction; Optical films; Optical scattering; Phonons; Raman scattering; Superconducting films; X-ray diffraction; X-ray scattering; Yttrium barium copper oxide; Co-evaporation; Raman scattering; YBCO films; local chemical variation;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2007.899434