Title :
Multiresolution analysis for reconstruction of conductivity profiles in eddy current nondestructive evaluation using probe impedance data
Author :
Shao, K.R. ; Guo, Youguang ; Lavers, J.D.
Author_Institution :
Dept. of Electr. Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
fDate :
7/1/2004 12:00:00 AM
Abstract :
This paper presents a wavelet-based multiresolution analysis method for solving the inverse problem in eddy current testing (ECT). Using the probe impedance signals as the measurement data, the reconstruction of conductivity profiles can be performed by a minimization scheme. The method allows to identify the regions where the perturbation may be localized and to retrieve the unknown parameters only in those regions. Some numerical simulation results show the feasibility of the technique.
Keywords :
eddy current testing; electric impedance; inverse problems; minimisation; wavelet transforms; conductivity profile reconstruction; eddy current testing; inverse problem solving; minimization; multiresolution analysis; nondestructive evaluation; perturbation localization; probe impedance change; probe impedance data; probe impedance signals; wavelet based analysis; Conductivity measurement; Eddy current testing; Eddy currents; Electrical capacitance tomography; Impedance measurement; Inverse problems; Multiresolution analysis; Performance evaluation; Probes; Wavelet analysis; Eddy current testing; inverse problems; multiresolution analysis; probe impedance change;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2004.832264