DocumentCode :
1074937
Title :
Monte Carlo estimation of hot carrier noise at millimeter- and submillimeter-wave frequencies
Author :
Grondin, Robert O. ; Blakey, Peter A. ; East, Jack R. ; Rothman, Edward D.
Author_Institution :
University of Michigan, Ann Arbor, MI
Volume :
28
Issue :
8
fYear :
1981
fDate :
8/1/1981 12:00:00 AM
Firstpage :
914
Lastpage :
923
Abstract :
This paper deals with the use of Monte Carlo experiments for investigating noise phenomena associated with hot carrier transport in semiconductors. In the first part of the paper procedures and problems associated with the design and interpretation of such experiments are discussed. The use of a Monte Carlo experiment is then demonstrated by estimating the velocity fluctuation spectrum of electrons in GaAs. Significant new results and insights are obtained. In particular, two new Spectral peaks are discovered and explained in terms of underlying physical processes, certain simple intuitive assumptions often made in noise theory are shown to be unjustified, and a criterion for the minimum flight time needed for estimates of "conventional" diffusion coefficients is obtained.
Keywords :
Electrons; Fluctuations; Frequency estimation; Gallium arsenide; Hot carriers; Microscopy; Monte Carlo methods; Noise shaping; Semiconductor device noise; Time series analysis;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1981.20459
Filename :
1481611
Link To Document :
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