Title :
Identification of the place causing Barkhausen noise in yoke type MR heads
Author :
Nakai, K. ; Kira, T. ; Minakata, R. ; Okamoto, N. ; Komoda, T.
Author_Institution :
Sharp Corp., Nara, Japan
fDate :
11/1/1993 12:00:00 AM
Abstract :
In yoke-type magnetoresistive (MR) heads, Barkhausen noise occurs in different regions depending on various applied fields. The place causing the noise can be specified by comparing the observed change of noise with the calculated field distribution in the head when an internal bias is superimposed on a uniform external field. Using a recording coil current instead of a uniform external field, noise from a bottom yoke or a substrate is clearly detected
Keywords :
Barkhausen effect; magnetic heads; magnetic recording; magnetic thin film devices; magnetoresistive devices; noise; Barkhausen noise; FeAlSi film; MR heads; Mn1-xZnxFe2O4 substrate; MnZn ferrite; field distribution; recording coil current; yoke type magnetoresistive head; Coils; Conductors; Ferrites; Laboratories; Magnetic flux; Magnetic heads; Mechatronics; Research and development; Substrates; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
