Title :
Modeling of Vortex Paths in HTS
Author :
Long, N.J. ; Strickland, N.M. ; Talantsev, E.F.
Author_Institution :
Ind. Res. Ltd., Hutt Lower
fDate :
6/1/2007 12:00:00 AM
Abstract :
A random walk model of the vortex paths in high temperature superconductors is investigated for different relative densities of c-axis, ab-plane and point pinning defects. The model suggests an origin for some of the more unusual features seen in the field angle dependence of the critical current. It also predicts greater noise in critical currents for fields parallel to the plane of the dominant pinning defects and anomalous behavior of n-values. The random walk model also suggests an alternative form for the expected field angle dependence of the upper critical fields in disordered layered superconductors.
Keywords :
critical current density (superconductivity); flux flow; flux pinning; high-temperature superconductors; HTS; critical currents; disordered layered superconductors; high temperature superconductors; point pinning defects; random walk model; relative densities; vortex path modeling; Anisotropic magnetoresistance; Critical current; Equations; Fluctuations; High temperature superconductors; Physics; Probability distribution; Shape; Statistical distributions; Superconducting device noise; Critical currents; critical fields; pinning; vortices;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2007.899119