Title :
Detection of Hot Electron-Induced Radiation Damage in Organic Dielectrics by Exoelectron Emission from Thin Films
Author :
Cartier, E. ; Pfluger, P.
Author_Institution :
Brown Boveri Research Center Baden Switzerland
fDate :
4/1/1987 12:00:00 AM
Abstract :
Charge trapping in thin dielectric films on metal substrates is investigated by thermally and optically stimulated exoelectron emission. The techniques are used to detect hot-electron-induced chemical degradation of hydrocarbon films. Radiation-induced electron traps are found if the films are irradiated with hot electrons above a threshold energy of 3.5 to 4 eV.
Keywords :
Charge carrier processes; Dielectric films; Dielectric substrates; Dielectric thin films; Electron optics; Electron traps; Gas detectors; Optical films; Radiation detectors; Stimulated emission;
Journal_Title :
Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TEI.1987.298868
