• DocumentCode
    1075204
  • Title

    Grain influences on domains and read-back pulse distortions of ferrite MIG heads

  • Author

    Schäfer, Rudolf ; Argyle, Bernell E. ; Takayama, Shinji ; Dingley, David

  • Author_Institution
    IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    29
  • Issue
    6
  • fYear
    1993
  • fDate
    11/1/1993 12:00:00 AM
  • Firstpage
    3876
  • Lastpage
    3878
  • Abstract
    Direct observations using microellipsometry, Kerr microscopy, and electron backscatter diffraction are made for the first time on individual grains in the leading pole-tip region of polycrystalline ferrite MIG heads intended for narrow track (⩽10-μm) data recording. These observations, compared with readback-after-write waveforms, indicate that waveform instabilities and asymmetry which can cause high error rate would be diminished by controlling grain size and orientation in this critical pole-tip region. When large grains (near the gap) exceed the single domain size (≃5 μm) but are oriented so their media-facing surface contains an easy-axis of magnetization, the head produces smaller asymmetry and instability than when missoriented (large) gap grains or multiple single-domain size grains are present
  • Keywords
    ellipsometry; ferrite devices; magnetic domains; magnetic heads; magnetisation; particle backscattering; Kerr microscopy; asymmetry; electron backscatter diffraction; error rate; ferrite MIG heads; grain orientation; grain size; magnetization; media-facing surface; metal-in-gap recording heads; microellipsometry; multiple single-domain size grains; narrow-track data recording; pole-tip region; read-back pulse distortions; readback-after-write waveforms; waveform instabilities; Ferrites; Grain size; Magnetic anisotropy; Magnetic heads; Magnetic separation; Magnetostriction; Perpendicular magnetic anisotropy; Polarization; Pulse measurements; Saturation magnetization;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.281328
  • Filename
    281328