DocumentCode :
1075207
Title :
The effects of the coupled slotline mode and air-bridges on CPW and NLC waveguide discontinuities
Author :
Lee, Chung-Yi ; Liu, Yaozhong ; Itoh, Tatsuo
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Volume :
43
Issue :
12
fYear :
1995
fDate :
12/1/1995 12:00:00 AM
Firstpage :
2759
Lastpage :
2765
Abstract :
The extended spectral domain analysis is applied to analyze symmetrical and asymmetrical coplanar and non-leaky coplanar waveguide discontinuities. The three-dimensional dyadic Green´s function is derived first to calculate the contributions of horizontal (vertical) magnetic (electrical) currents. No air-bridges are needed if the discontinuity is symmetrical, It is shown that the coupled slotline (CSL) mode excited by asymmetrical discontinuities drastically affects the CPW circuit performance. The effect of air-bridges used to suppress the unwanted CSL mode is studied. Experimental data agree very well with numerical results for CPW discontinuities. In addition, the discontinuities of a novel conductor-backed CPW structure, the non-leaky coplanar (NLC) waveguide, are also investigated. From experiment, it is found that the SMA-to-NLC transition causes power leakage. Except for the small leakage, theoretical and experimental results agree well
Keywords :
Green´s function methods; coplanar waveguides; spectral-domain analysis; waveguide discontinuities; waveguide theory; 3D dyadic Green function; CPW circuit performance; CPW discontinuities; NLC waveguide discontinuities; SMA-to-NLC transition; air-bridges; asymmetrical discontinuities; conductor-backed CPW structure; coupled slotline mode; extended spectral domain analysis; nonleaky coplanar waveguide discontinuities; power leakage; symmetrical discontinuities; Circuit optimization; Coplanar waveguides; Coupled mode analysis; Coupling circuits; Image analysis; Magnetic analysis; Magnetic domains; Slotline; Spectral analysis; Waveguide discontinuities;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.475632
Filename :
475632
Link To Document :
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