Title :
Analytical solutions to electron imaging of head fields
Author :
Walmsley, N.S. ; Hart, A. ; Parker, D.A. ; Chantrell, R.W.
Author_Institution :
Dept. of Math. & Stat., Univ. of Central Lancashire, Preston, UK
fDate :
11/1/1993 12:00:00 AM
Abstract :
Magnetic microstructural information of the stray field of a recording head may be obtained by Lorentz microscopy. This involves measuring the deflection, due to the Lorentz force, experienced by an electron as it passes through the stray field. Using a simplified model of a head, an analytical solution has been derived that gives the integrated Lorentz force experienced by an electron as it passes through the stray field of a thin-film recording head
Keywords :
electron microscopy; magnetic field measurement; magnetic heads; magnetic thin film devices; Lorentz microscopy; electron imaging; head fields; integrated Lorentz force; magnetic microstructural information; stray field; thin-film recording head; Electrons; Force measurement; Image analysis; Lorentz covariance; Magnetic analysis; Magnetic field measurement; Magnetic force microscopy; Magnetic heads; Magnetic recording; Micromagnetics;
Journal_Title :
Magnetics, IEEE Transactions on
