DocumentCode
1075264
Title
An anomalous increase of threshold voltages with shortening the channel lengths for deeply boron-implanted N-channel MOSFET´s
Author
Nishida, Masanori ; Onodera, Hiroshi
Author_Institution
Tokyo Sanyo Electric Company Limited, Gumma-ken, Japan
Volume
28
Issue
9
fYear
1981
fDate
9/1/1981 12:00:00 AM
Firstpage
1101
Lastpage
1103
Abstract
In relatively heavily and deeply boron-implanted n-channel MOSFET´s, we found the anomalous phenomenon that the threshold voltage increases with decreasing channel length over a wide range of channel lengths. This is quite contrary to the well-known short-channel effect associated with the dependence of the threshold voltage on the channel length. It is difficult to explain this phenomenon directly by any simplified models that have been presented to date. In this brief, we present mainly the detailed experimental results of such an anomalous short-channel effect.
Keywords
Contact resistance; Costs; Fabrication; Geometry; Integrated circuit packaging; MOS devices; MOSFET circuits; Parametric study; Silicon; Threshold voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1981.20494
Filename
1481646
Link To Document