• DocumentCode
    1075264
  • Title

    An anomalous increase of threshold voltages with shortening the channel lengths for deeply boron-implanted N-channel MOSFET´s

  • Author

    Nishida, Masanori ; Onodera, Hiroshi

  • Author_Institution
    Tokyo Sanyo Electric Company Limited, Gumma-ken, Japan
  • Volume
    28
  • Issue
    9
  • fYear
    1981
  • fDate
    9/1/1981 12:00:00 AM
  • Firstpage
    1101
  • Lastpage
    1103
  • Abstract
    In relatively heavily and deeply boron-implanted n-channel MOSFET´s, we found the anomalous phenomenon that the threshold voltage increases with decreasing channel length over a wide range of channel lengths. This is quite contrary to the well-known short-channel effect associated with the dependence of the threshold voltage on the channel length. It is difficult to explain this phenomenon directly by any simplified models that have been presented to date. In this brief, we present mainly the detailed experimental results of such an anomalous short-channel effect.
  • Keywords
    Contact resistance; Costs; Fabrication; Geometry; Integrated circuit packaging; MOS devices; MOSFET circuits; Parametric study; Silicon; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1981.20494
  • Filename
    1481646