Title :
Kerr Electro-Optic Field Mapping Measurements in Electron Beam Irradiated Polymethylmethacrylate
Author :
Zahn, M. ; Hikita, M. ; Wright, K.A. ; Cooke, C.M. ; Brennan, J.
Author_Institution :
Massachusetts Institute of Technology Department of Electrical Engineering and Computer Science Laboratory for Electromagnetic and Electronic Systems High Voltage Research Laboratory Cambridge, MA
fDate :
4/1/1987 12:00:00 AM
Abstract :
Kerr electro-optic field mapping measurements are presented in electron beam irradiated polymethylmethacrylate (PMMA) where the accumulated trapped charge results in large self-electric fields of the order of 1 to 2.5 MV/ cm. The resulting numerous light maximum and minimum recorded on photographic film and videotape allow accurate measurement of the time dependence of the electric field and space charge distributions.
Keywords :
Charge measurement; Current measurement; Electric variables measurement; Electromagnetic measurements; Electron beams; Laboratories; Optical polarization; Photomultipliers; Voltage; Wavelength measurement;
Journal_Title :
Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TEI.1987.298879
