DocumentCode
1075309
Title
Single-mode junction-up TJS lasers with estimated lifetime of 106hours
Author
Nita, Shigeyuki ; Namizaki, Hirofumi ; Takamiya, Saburo ; Susaki, Wataru
Author_Institution
Mitsubishi Electric Corporation, Hyogo, Japan
Volume
15
Issue
11
fYear
1979
fDate
11/1/1979 12:00:00 AM
Firstpage
1208
Lastpage
1209
Abstract
Accelerated life test for single-mode junction-up TJS lasers have been carried out at ambient temperatures of 50, 60, 70, 80, and 90°C. The laser chips are passivated with Si3 N4 films and die bonded on Si submounts. Estimated mean time to failure is 106h at 25°C.
Keywords
Semiconductor lasers; Bonding; Laser modes; Life estimation; Life testing; Lifetime estimation; Power lasers; Semiconductor films; Surface emitting lasers; Temperature; Waveguide lasers;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1979.1069917
Filename
1069917
Link To Document