Title :
Single-mode junction-up TJS lasers with estimated lifetime of 106hours
Author :
Nita, Shigeyuki ; Namizaki, Hirofumi ; Takamiya, Saburo ; Susaki, Wataru
Author_Institution :
Mitsubishi Electric Corporation, Hyogo, Japan
fDate :
11/1/1979 12:00:00 AM
Abstract :
Accelerated life test for single-mode junction-up TJS lasers have been carried out at ambient temperatures of 50, 60, 70, 80, and 90°C. The laser chips are passivated with Si3N4films and die bonded on Si submounts. Estimated mean time to failure is 106h at 25°C.
Keywords :
Semiconductor lasers; Bonding; Laser modes; Life estimation; Life testing; Lifetime estimation; Power lasers; Semiconductor films; Surface emitting lasers; Temperature; Waveguide lasers;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1979.1069917
