• DocumentCode
    1075309
  • Title

    Single-mode junction-up TJS lasers with estimated lifetime of 106hours

  • Author

    Nita, Shigeyuki ; Namizaki, Hirofumi ; Takamiya, Saburo ; Susaki, Wataru

  • Author_Institution
    Mitsubishi Electric Corporation, Hyogo, Japan
  • Volume
    15
  • Issue
    11
  • fYear
    1979
  • fDate
    11/1/1979 12:00:00 AM
  • Firstpage
    1208
  • Lastpage
    1209
  • Abstract
    Accelerated life test for single-mode junction-up TJS lasers have been carried out at ambient temperatures of 50, 60, 70, 80, and 90°C. The laser chips are passivated with Si3N4films and die bonded on Si submounts. Estimated mean time to failure is 106h at 25°C.
  • Keywords
    Semiconductor lasers; Bonding; Laser modes; Life estimation; Life testing; Lifetime estimation; Power lasers; Semiconductor films; Surface emitting lasers; Temperature; Waveguide lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1979.1069917
  • Filename
    1069917