• DocumentCode
    1075325
  • Title

    Majority carrier current characteristics in large-grain polycrystalline-silicon-Schottky-barrier solar cells

  • Author

    Yang, E.S. ; Poon, E.K. ; Wu, C.M. ; Hwang, W. ; Card, H.C.

  • Author_Institution
    Columbia University, New York, NY
  • Volume
    28
  • Issue
    10
  • fYear
    1981
  • fDate
    10/1/1981 12:00:00 AM
  • Firstpage
    1131
  • Lastpage
    1135
  • Abstract
    A theoretical analysis is made of the nonexponential current-voltage characteristics observed in Al-poly-Si (Wacker) Schottky-barrier solar cells fabricated in our laboratory. In this model, we consider a grain boundary effectively in parallel with the Schottky junction. Comparison between experimental data and numerical calculation indicates that the grain boundary may be represented by a fixed interface charge, a uniformly distributed interface state density, and a neutral level E0. Diodes fabricated in regions with high-angle grain boundaries behave in a manner which conforms closely with the proposed model.
  • Keywords
    Chemicals; Conductivity; Grain boundaries; Interface states; Laboratories; Photovoltaic cells; Schottky barriers; Schottky diodes; Semiconductor device modeling; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1981.20500
  • Filename
    1481652