DocumentCode :
1075349
Title :
An accurate design method of bipolar devices using a two-dimensional device simulator
Author :
Tomizawa, Masaaki ; Kitazawa, Hitoshi ; Yoshii, Akira ; Horiguchi, Shoji ; Sudo, Tsuneta
Author_Institution :
Nippon Telegraph and Telephone Public Corporation, Tokyo, Japan
Volume :
28
Issue :
10
fYear :
1981
fDate :
10/1/1981 12:00:00 AM
Firstpage :
1148
Lastpage :
1153
Abstract :
The systematic application of two-dimensional analysis for the bipolar device design is described. In this analysis, surface recombination is taken into account by properly modifying the carrier lifetime term, in addition to mobility variations and bandgap narrowing effects. Moreover, an effective method to obtain terminal currents from the calculated current densities is introduced. The analysis of transistors with different emitter length demonstrates the validity of this procedure. The propagation delay time of IIL also is calculated using V-I characteristics and capacitances obtained by this two-dimensional analysis. The results give good agreement with experimental ones. IIL and SFL with subnanosecond gate delay time are designed with the suitable geometry and doping profiles by the two-dimensional analysis.
Keywords :
Capacitance-voltage characteristics; Current density; Delay; Design methodology; Differential equations; Doping profiles; Finite element methods; Geometry; Impurities; Radiative recombination;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1981.20502
Filename :
1481654
Link To Document :
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