Generation and detection of picosecond electric pulses with freely positionable photoconductive probes

Author

Pfeifer, Torsten ; Heiliger, Hanns-Michael ; Roskos, Hartmut G. ; Kurz, Heinrich

Author_Institution

Inst. fur Halbleitertech. II, Tech. Hochschule Aachen, Germany

Volume

43

Issue

12

fYear

1995

fDate

12/1/1995 12:00:00 AM

Firstpage

2856

Lastpage

2862

Abstract

Two different kinds of external photoconductive probes are investigated in detail. Their dual character in application as generators or detectors of picosecond electric transients is demonstrated. The probes are manufactured on transparent silicon-on-sapphire substrates suitable for on-wafer testing of integrated circuits. A detailed analysis of the freely positionable probes is performed in time domain with respect to linearity, sensitivity, time resolution and invasiveness

Keywords

high-speed optical techniques; integrated circuit testing; photoconducting devices; probes; pulse generators; submillimetre wave measurement; transient analysers; Al₂O₃; Si-Al₂O₃; Si-on-sapphire substrates; electro optically detected pulses; freely positionable photoconductive probes; invasiveness; linearity; on-wafer IC testing; optoelectronic measurement; picosecond electric pulse detection; picosecond electric pulse generation; picosecond electric transients; sensitivity; time domain analysis; time resolution; ultrafast electric signals; Character generation; Circuit analysis; Circuit testing; Detectors; Integrated circuit manufacture; Integrated circuit testing; Performance analysis; Photoconductivity; Probes; Pulse generation;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.475646

Filename

475646