Title :
Magnetic resistivity measurements in nickel films for CIW and CPW domain geometries
Author :
Snowden, D.S. ; Checkelsky, J.G. ; Harberger, S.S. ; Stern, N.P. ; Eckert, J.C. ; Sparks, P.D.
Author_Institution :
Dept. of Phys., Harvey Mudd Coll., Claremont, CA, USA
fDate :
7/1/2004 12:00:00 AM
Abstract :
We report magnetoresistance measurements on Ni films with two stripe domain orientations. Measurements were taken for both current parallel to the domain walls (CIW) and current perpendicular to the domain walls (CPW). We observe a negative magnetoresistance for the field applied perpendicular to the plane. For CIW, we observe an added resistance, ΔRCIW/R(2 T), that vanishes after an applied field removes the ordered domains. The ΔRCPW/R(2 T) is comparable to the ΔR/R(2 T) for the disordered domain structure observed after the field is removed. We find ΔRCPW/ΔRCIW is less than one, which is not consistent with previous work.
Keywords :
ferromagnetic materials; magnetic domain walls; magnetic thin films; magnetoresistance; nickel; CIW domain geometries; CPW domain geometries; Ni; current parallel to domain walls; current perpendicular to domain walls; disordered domain structure; domain-wall resistance; magnetic resistivity measurements; magnetoresistance measurements; negative magnetoresistance; nickel films; ordered domains; stripe domain orientations; striped magnetic domains; Conductivity measurement; Coplanar waveguides; Electrical resistance measurement; Geometry; Magnetic domain walls; Magnetic domains; Magnetic field measurement; Magnetic films; Magnetoresistance; Nickel; Domain-wall resistance; magnetoresistance; nickel; striped magnetic domains;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2004.830450