Immediate soft error detection using pass gate logic for content addressable memory

Content addressable memory (CAM) is used in many applications. As the process technology scales into the deep sub-micron regime, soft error rate increases significantly. Densely integrated memory cells in CAM are prone to soft errors. Bit flipping in CAM leads to an incorrect search operation which could be fatal from a system point of view. The proposed scheme enables the detection of soft errors immediately and the correction of problems with small additional logic gates.