Investigation on tape-head contact in VTR

Author

Okuwaki, T. ; Kawakita, T. ; Akahane, N. ; Kusumoto, K.

Author_Institution

Hitachi Maxell, Ltd., Kyoto, Japan

Volume

29

Issue

6

fYear

1993

fDate

11/1/1993 12:00:00 AM

Firstpage

3954

Lastpage

3956

Abstract

Describes the tape-head contact, especially the spacing between the tape and the head in video tape recorders (VTRs), from the viewpoint of tape surface roughness. The spacing was measured by the optical interference method, and the surface roughness by an optical noncontact microsurface measurement system. The spacing, obtained by the phase-shift correction of the reflected light, is found to be equal to the surface roughness P-O (peak to O level) value of the tape. This assures that the output voltage of metal evaporated (ME) tape is larger than that of metal powder (MP) tape by only about +2 dB at the wavelength w=0.49 μm except for the spacing effect caused by the tape surface roughness

Keywords

light interferometry; magnetic heads; surface topography measurement; video tape recorders; VTR; metal evaporated tape; metal powder tape; optical interference method; optical noncontact microsurface measurement system; output voltage; phase-shift correction; tape surface roughness; tape-head contact; Interference; Magnetic heads; Optical recording; Optical surface waves; Powders; Rough surfaces; Surface roughness; Surface waves; Video recording; Voltage;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.281354

Filename

281354