• DocumentCode
    1075547
  • Title

    On the verification of hypothesized matches in model-based recognition

  • Author

    Grimson, W. Eric L ; Huttenlocher, Daniel P.

  • Author_Institution
    Artificial Intelligence Lab., MIT, Cambridge, MA, USA
  • Volume
    13
  • Issue
    12
  • fYear
    1991
  • fDate
    12/1/1991 12:00:00 AM
  • Firstpage
    1201
  • Lastpage
    1213
  • Abstract
    Model-based recognition methods generally use ad hoc techniques to decide whether or not a model of an object matches a given scene. The most common such technique is to set an empirically determined threshold on the fraction of model features that must be matched to data features. Conditions under which to accept a match as correct are rigorously derived. The analysis is based on modeling the recognition process as a statistical occupancy problem. This model makes the assumption that pairings of object and data features can be characterized as a random process with a uniform distribution. The authors present a number of examples illustrating that real image data are well approximated by such a random process. Using a statistical occupancy model, they derive an expression for the probability that a randomly occurring match will account for a given fraction of the features of a particular object. This expression is a function of the number of model features, the number of data features, and bounds on the degree of sensor noise. It provides a means of setting a threshold such that the probability of a random match is very small
  • Keywords
    computer vision; nonparametric statistics; probability; random processes; computer vision; data features; hypothesis verification; model features; model-based recognition; nonparametric statistics; probability; random match; random process; statistical occupancy; Image analysis; Image recognition; Layout; Machine vision; Object recognition; Probability; Random processes; Sensor phenomena and characterization; Solid modeling; Testing;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.106994
  • Filename
    106994