Internal-node waveform analysis of MMIC power amplifiers

Author

Wei, Ce-Jun ; Tkachenko, Yevgeniy A. ; Hwang, James C M ; Smith, Kenneth R. ; Peake, Andrew H.

Author_Institution

Lehigh Univ., Bethlehem, PA, USA

Volume

43

Issue

12

fYear

1995

fDate

12/1/1995 12:00:00 AM

Firstpage

3037

Lastpage

3042

Abstract

A novel internal-node waveform probing technique has been demonstrated on a C-band monolithic microwave integrated circuit (MMIC) power amplifier. The error of the measurement and its perturbance to circuit operation was estimated and verified to be within ±10%. Valuable insight was obtained from the variation of waveforms as a function of frequency, drive and location. The potential impact of this technique includes MMIC design verification, in-situ device model extraction, process diagnosis, and reliability assessment

Keywords

MMIC power amplifiers; integrated circuit testing; measurement errors; microwave measurement; probes; waveform analysis; C-band; MMIC power amplifiers; design verification; in-situ device model extraction; internal-node waveform probing technique; monolithic microwave integrated circuit; process diagnosis; reliability assessment; Impedance; MMICs; Microwave amplifiers; Microwave theory and techniques; Power amplifiers; Power transmission lines; Probes; Resistors; Sampling methods; Voltage;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.475671

Filename

475671