DocumentCode
1075696
Title
Variable Temperature Total AC Loss and Stability Characterization Facility
Author
Pamidi, Sastry ; Nguyen, Doan ; Zhang, Guomin ; Knoll, David ; Trociewitz, Ulf ; Schwartz, Justin
Author_Institution
Florida State Univ., Tallahassee
Volume
17
Issue
2
fYear
2007
fDate
6/1/2007 12:00:00 AM
Firstpage
3179
Lastpage
3182
Abstract
The design of a versatile ac loss and stability characterization facility for high temperature superconducting materials suitable for variable temperature measurements is described. A non-metallic vessel inside a transverse field double-helix magnet acts as the measurement chamber. A cryocooler cools the samples to a target measurement temperature between 35 and 80 K. The facility is suitable for measurements on samples as long as 15 cm with ac transport current and ac background magnetic field, both at variable frequency. The facility allows for sample rotation to vary its orientation with respect to the magnetic field. Initial temperature measurements showed that the sample could be maintained at uniform temperature to plusmn0.5 K. AC loss measurements performed on a precursor setup, identical in concept, confirmed the suitability of the double-helix magnet design and cryocooler based cooling arrangement.
Keywords
barium compounds; electric current measurement; high-temperature superconductors; temperature measurement; yttrium compounds; AC loss measurements; YBa2Cu3O7 - System; ac transport current; cryocooler; high temperature superconducting materials; nonmetallic vessel; stability characterization facility; temperature 35 K to 80 K; transverse field double-helix magnet; variable temperature measurements; Cooling; Current measurement; Frequency measurement; Loss measurement; Magnetic field measurement; Performance evaluation; Stability; Superconducting magnets; Superconducting materials; Temperature measurement; AC loss; high-temperature superconductors; stability; superconducting filaments and wires;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2007.899038
Filename
4278238
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