Analysis of DC noise in thin film media

Author

Bertram, H.N. ; Marrow, M. ; Ohno, J. ; Wolf, J.K.

Author_Institution

Center for Magnetic Recording Res., Univ. of California, La Jolla, CA, USA

Volume

40

Issue

4

fYear

2004

fDate

7/1/2004 12:00:00 AM

Firstpage

2311

Lastpage

2313

Abstract

Uniform magnetization (dc) noise is studied using numerically generated arrays of grains. The effects of packing fraction, grain size distribution, and anisotropy orientation are examined. From electron microscopy results, in this initial study, the intergranular grain boundary separation is held fixed. In general, the dc noise increases with increasing grain size distribution and decreases with increasing packing fraction. For a planar random anisotropy distribution, the noise is about an order of magnitude larger than that for well-oriented media. For typical parameters, the dc noise can be less than the transition noise for oriented media and is always significantly larger for planar random media.

Keywords

electron microscopy; grain boundaries; grain size; magnetic anisotropy; magnetic noise; magnetic particles; magnetic thin film devices; magnetisation; DC noise; anisotropy distribution; anisotropy orientation; electron microscopy; grain arrays; grain size distribution; intergranular grain boundary separation; magnetic recording; magnetization noise; oriented media; packing fraction; planar random media; thin film granular media; thin film media; transition noise; uniform magnetization; well-oriented media; Anisotropic magnetoresistance; DC generators; Electron microscopy; Grain boundaries; Grain size; Magnetic analysis; Magnetization; Noise generators; Random media; Transistors; Magnetic recording; magnetization noise; thin film granular media;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2004.833171

Filename

1325488