Title :
Analysis of DC noise in thin film media
Author :
Bertram, H.N. ; Marrow, M. ; Ohno, J. ; Wolf, J.K.
Author_Institution :
Center for Magnetic Recording Res., Univ. of California, La Jolla, CA, USA
fDate :
7/1/2004 12:00:00 AM
Abstract :
Uniform magnetization (dc) noise is studied using numerically generated arrays of grains. The effects of packing fraction, grain size distribution, and anisotropy orientation are examined. From electron microscopy results, in this initial study, the intergranular grain boundary separation is held fixed. In general, the dc noise increases with increasing grain size distribution and decreases with increasing packing fraction. For a planar random anisotropy distribution, the noise is about an order of magnitude larger than that for well-oriented media. For typical parameters, the dc noise can be less than the transition noise for oriented media and is always significantly larger for planar random media.
Keywords :
electron microscopy; grain boundaries; grain size; magnetic anisotropy; magnetic noise; magnetic particles; magnetic thin film devices; magnetisation; DC noise; anisotropy distribution; anisotropy orientation; electron microscopy; grain arrays; grain size distribution; intergranular grain boundary separation; magnetic recording; magnetization noise; oriented media; packing fraction; planar random media; thin film granular media; thin film media; transition noise; uniform magnetization; well-oriented media; Anisotropic magnetoresistance; DC generators; Electron microscopy; Grain boundaries; Grain size; Magnetic analysis; Magnetization; Noise generators; Random media; Transistors; Magnetic recording; magnetization noise; thin film granular media;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2004.833171