DocumentCode :
107578
Title :
Silicon-Controlled Rectifier for Electrostatic Discharge Protection Solutions With Minimal Snapback and Reduced Overshoot Voltage
Author :
Ruei-Cheng Sun ; Zhixin Wang ; Klebanov, Maxim ; Wei Liang ; Liou, Juin J. ; Don-Gey Liu
Author_Institution :
Ph.D. Program of Electr. & Commun. Eng., Feng Chia Univ., Taichung, Taiwan
Volume :
36
Issue :
5
fYear :
2015
fDate :
May-15
Firstpage :
424
Lastpage :
426
Abstract :
An electrostatic discharge (ESD) protection structure constructed by the stacking of multiple anode gate-cathode gate directly connected silicon-controlled rectifiers (DCSCRs), fabricated in a 0.18-μm CMOS technology is reported in this letter. Two embedded diodes in the DCSCR dictate the turn-ON mechanism and hence give rise to a trigger voltage equal to twice the diode´s turn-ON voltage. This approach enables the DCSCR to offer a diode-like transmission line pulsing IV characteristic with a minimal snapback and a SCR-like high-ESD robustness. At 25 °C, DCSCR has an acceptable nanoampere-level leakage current. Besides, it is verified that the DCSCR can significantly reduce overshoot voltage when stressed by very-fast-rising pulses. As such, an ESD clamp constructed by stacking a selected number of DCSCRs can offer a flexible trigger/holding voltage and is suitable for low and medium voltage ESD protection applications.
Keywords :
CMOS integrated circuits; electrostatic discharge; leakage currents; protection; thyristors; CMOS; Si; diode-like transmission line pulsing IV characteristic; electrostatic discharge protection solutions; embedded diodes; minimal snapback; multiple anode gate; nanoampere-level leakage current; reduced overshoot voltage; silicon-controlled rectifier; size 0.18 mum; temperature 25 degC; trigger voltage; turn-ON mechanism; turn-ON voltage; CMOS integrated circuits; Electrostatic discharges; Leakage currents; Logic gates; Stacking; Thyristors; Transmission line measurements; ESD; SCR; direct-connected; overshoot; stacking;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2015.2413844
Filename :
7063252
Link To Document :
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