DocumentCode :
1075839
Title :
Crystal orientation of Mn-Ir antiferromagnetic films for exchange-biased soft-magnetic underlayer in perpendicular recording media
Author :
Suzuki, Toshio ; Ouchi, Kazuhiro
Author_Institution :
Akita Res. Inst. of Adv. Technol., Japan
Volume :
40
Issue :
4
fYear :
2004
fDate :
7/1/2004 12:00:00 AM
Firstpage :
2347
Lastpage :
2349
Abstract :
Three kinds of crystal orientations for Mn-Ir antiferromagnetic films were successfully obtained on the glass disk substrates. Mn-Ir(111) film was prepared on an underlayer of Nb-Permalloy/Ta/glass-disk. Mn-Ir(001) film was obtained on MgO/glass-disk. On the other hand, Nb-Permalloy was found to exhibit [110] orientation at sputtering temperatures between 200°C and 400°C on the MgO layer, thus Mn-Ir(110) was first realized on the underlayer of Nb-Permalloy/MgO/glass-disk. The exchange-bias fields, Hex, and possibility of increasing the Hex were investigated.
Keywords :
Permalloy; antiferromagnetic materials; crystal orientation; exchange interactions (electron); manganese alloys; perpendicular magnetic recording; soft magnetic materials; sputter deposition; 200 to 400 C; MnIr-MgO; Nb-Permalloy; antiferromagnetic films; crystal orientation; exchange-bias fields; exchange-biased soft-magnetic underlayer; glass disk substrates; perpendicular recording media; Amorphous materials; Antiferromagnetic materials; Crystallization; Glass; Magnetic films; Perpendicular magnetic recording; Sputtering; Substrates; Temperature; X-ray scattering; Crystal orientation; MgO; MnIr; exchange bias; permalloy; perpendicular magnetic recording;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2004.830418
Filename :
1325500
Link To Document :
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