• DocumentCode
    107588
  • Title

    Detecting Point Pattern of Multiple Line Segments Using Hough Transformation

  • Author

    Yuhang Liu ; Shiyu Zhou

  • Author_Institution
    Ind. & Syst. Eng. Dept., Univ. of Wisconsin-Madison, Madison, WI, USA
  • Volume
    28
  • Issue
    1
  • fYear
    2015
  • fDate
    Feb. 2015
  • Firstpage
    13
  • Lastpage
    24
  • Abstract
    Surface defects in manufacturing often exhibit particular spatial patterns. These patterns contain valuable information about the manufacturing process and can help to identify potential root causes. In this paper, we present a new method to detect the point patterns that consist of multiple line segments. The basic idea is that by using the Hough transformation, we convert the point pattern detection problem into a simple point matching problem. Compared with the existing point pattern matching methods, the proposed method does not require training data and is relatively easy to implement and compute. The details of the detection algorithm are presented and the parameter selection and performance evaluation of this method are investigated. Case studies are presented to validate the effectiveness of this method.
  • Keywords
    Hough transforms; pattern recognition; Hough transformation; detection algorithm; multiple line segments; parameter selection; performance evaluation; point matching problem; point pattern; Algorithm design and analysis; Manufacturing processes; Noise measurement; Pattern matching; Shape; Strips; Surface treatment; Hough Transform; Hough transform (HT); pattern detection; surface quality control;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2014.2385600
  • Filename
    6995982