DocumentCode :
1075895
Title :
Pattern dependent overwrite on thick media
Author :
Dee, Richard H. ; Franzel, Kenneth S. ; Jurneke, Joe
Author_Institution :
Storage Technology Corp., Louisville, CO, USA
Volume :
29
Issue :
6
fYear :
1993
fDate :
11/1/1993 12:00:00 AM
Firstpage :
4059
Lastpage :
4061
Abstract :
Overwrite measurements on thick media as a function of the recorded data pattern and record current level are presented. Two recording methods are addressed, full wave NRZI recording and double density NRZI (D2NRZI). The overwrite using NRZI recording is poor on thick media as low density signals are recorded deep into the media. Significant improvement is seen when extra higher density transitions are introduced between data ONEs for the D2-NRZI method which restricts the recording depth of low frequency components. However, the residual signal at the fundamental frequency of the data pattern is higher for long strings of ZEROs between ONEs than short strings, which is attributed to the reproduce head response
Keywords :
magnetic heads; magnetic recording; magnetic tapes; CrO2 tape; D2-NRZI method; NRZI recording; Ni1-xZnxFe2O4; NiZn ferrite head; double density NRZI; fundamental frequency; head response; low density signals; pattern dependent overwrite; recorded data pattern; recording depth; Control systems; Current measurement; Density measurement; Disk recording; Ferrites; Frequency; Hard disks; Magnetic heads; Thickness measurement; Writing;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.281390
Filename :
281390
Link To Document :
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