DocumentCode
1075954
Title
Exchange bias enhancement through interdiffusion of NiFe/FeMn/metal films
Author
Chen, Mao-Min ; Tsang, Ching ; Gharsallah, N.
Author_Institution
IBM AdStar, San Jose, CA, USA
Volume
29
Issue
6
fYear
1993
fDate
11/1/1993 12:00:00 AM
Firstpage
4077
Lastpage
4079
Abstract
The exchange bias field of the NiFe/FeMn system was found to increase from 30-35 Oe up to 75 Oe by annealing a three layer film structure of NiFe(300 Å)/FeMn/M (M=Au,Rh,Pt,Cr,Cu, etc.) at elevated temperature. Auger electron spectroscopy shows that interdiffusion occurred in the multilayer structure between the FeMn and the metal layer. The increase in exchange bias field is attributed to the altered interface of NiFe/FeMn due to the interdiffusion
Keywords
Auger effect; annealing; chemical interdiffusion; exchange interactions (electron); ferromagnetic properties of substances; iron alloys; magnetic multilayers; manganese alloys; nickel alloys; sputtered coatings; 240 C; 300 angstroms; Auger electron spectroscopy; NiFe-FeMn; RF diode sputtering system; annealing; exchange bias field; interdiffusion; multilayer film; multilayer structure; Anisotropic magnetoresistance; Annealing; Antiferromagnetic materials; Chromium; Glass; Gold; Magnetic films; Nonhomogeneous media; Sputtering; Temperature;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.281395
Filename
281395
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