Title :
Synthetic antiferromagnetic soft underlayers for perpendicular recording media
Author :
Byeon, S.C. ; Misra, A. ; Doyle, W.D.
Author_Institution :
MINT Center, Univ. of Alabama, Tuscaloosa, AL, USA
fDate :
7/1/2004 12:00:00 AM
Abstract :
Synthetic antiferromagnetically coupled films have been studied for soft underlayers for perpendicular media. Initially, FeCo bilayers were prepared by dc magnetron sputtering with a structure of glass-Ru(2.5 nm)-FeCo(tF)-Ru(tRu)-FeCo(tF)-Ru (10 nm), where tF was varied from 5 to 200 nm and tRu from 0.2 to 1.4 nm. The antiferromagnetic coupling showed a maximum at tRu=0.6-1.0 nm as expected, depending on tF. However, the surface coupling energy JAF decreased very rapidly with tF from 2.8 erg/cm2 at tF=5 nm to 0.6erg/cm2 at tF=10 nm. A structure of glass-Ru(2.5 nm)-FeCo(50 nm)-Ru(1.0 nm)-FeCo(55 nm)-Ru (10 nm) showed nearly zero remanence and very well separated hysteresis segments at ±30 Oe along the FeCo easy axis and a single narrow hysteresis loop with coercivity of 3.5 Oe along the hard axis. These characteristics were thermally stable up to at least 200°C, which is superior to IrMn exchange-biased systems. Further optimization was achieved with a trilayer structure of glass-Ru(2.5 nm)-FeCo(25 nm)-Ru(1.0nm)-FeCo(45nm)-Ru(1.0 nm)-FeCo(25 nm)-Ru (10 nm).
Keywords :
antiferromagnetic materials; iron alloys; perpendicular magnetic recording; remanence; soft magnetic materials; sputtering; 0.2 to 1.4 nm; 0.6 to 1.0 nm; 5 to 200 nm; Ru-FeCo-Ru-FeCo-Ru; coercivity; dc magnetron sputtering; exchange-biased systems; narrow hysteresis loop; perpendicular recording media; soft underlayers; surface coupling; synthetic antiferromagnetic coupling; synthetic antiferromagnetically coupled films; thermal stability; trilayer structure; zero remanence; Antiferromagnetic materials; Hysteresis; Iron; Magnetic anisotropy; Magnetic films; Material storage; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Sputtering; Thermal stability; Perpendicular recording media; SAF; coupling; soft underlayer; synthetic antiferromagnetic; thermal stability;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2004.829260