Title :
VA-1 an indium phosphide MISFET integrated circuit technology
fDate :
10/1/1981 12:00:00 AM
Keywords :
Circuit testing; Digital integrated circuits; Electrons; Indium phosphide; Insulation; Integrated circuit technology; MISFETs; Pulse inverters; Ring oscillators; Silicon;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1981.20566