Title : 
VA-1 an indium phosphide MISFET integrated circuit technology
         
        
        
        
        
        
            fDate : 
10/1/1981 12:00:00 AM
         
        
        
        
            Keywords : 
Circuit testing; Digital integrated circuits; Electrons; Indium phosphide; Insulation; Integrated circuit technology; MISFETs; Pulse inverters; Ring oscillators; Silicon;
         
        
        
            Journal_Title : 
Electron Devices, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/T-ED.1981.20566