• DocumentCode
    1076146
  • Title

    Percolation studies in synthetic ferrimagnetic recording media

  • Author

    Ajan, Antony ; Abarra, E.N. ; Inomata, A. ; Shinohara, M. ; Yamagishi, W.

  • Author_Institution
    Fujitsu Labs. Ltd., Atsugi, Japan
  • Volume
    40
  • Issue
    4
  • fYear
    2004
  • fDate
    7/1/2004 12:00:00 AM
  • Firstpage
    2431
  • Lastpage
    2433
  • Abstract
    We have studied the percolation limit of synthetic ferrimagnetic media (SFM) by the measurement of noise power and third harmonic ratio and by imaging with a high-resolution magnetic force microscope (MFM). The noise power spectrum, which helps to find the onset of percolation, is significantly different in SFM structures compared to the conventional recording media. Properties of the stabilization layers, such as switching field distribution (SFD), are highly influential in deciding the integrated noise power spectrum. With suitable selection of high moment stabilization layers, the noise at higher densities, within the percolation density limit, can be substantially reduced. Third harmonic ratio studies indicate that the partial erasure occurs above ∼900 kfci. Using a high-resolution high-Q MFM, it is possible to obtain stable and nonpercolating high density patterns up to 1000 kfci on media with tBr=0.22 memu/cm2 and Hc∼4500 Oe. This results in practical designs of media for recording densities >150 Gbits/in2.
  • Keywords
    ferrimagnetic materials; magnetic force microscopy; magnetic recording noise; percolation; high density patterns; high moment stabilization layers; high-resolution magnetic force microscope; integrated noise power spectrum; noise power measurement; partial erasure; percolation density limit; percolation limit; recording densities; switching field distribution; synthetic ferrimagnetic recording media; third harmonic ratio; Ferrimagnetic materials; Force measurement; Magnetic field measurement; Magnetic force microscopy; Magnetic noise; Magnetic recording; Noise measurement; Power measurement; Power system harmonics; Signal to noise ratio; MFM; Magnetic force microscope; noise power; percolation; synthetic ferrimagnetic media; third harmonic ratio;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2004.829828
  • Filename
    1325528