Title :
Thermal decay and erasure process for perpendicular recording at 1 Tb/in2
Author :
Gao, Kai-Zhong ; Williams, Mason ; Zhou, Hong ; Fernandez-de-Castro, Juan ; Bertram, H. Neal
Author_Institution :
Seagate Technol., Bloomington, MN, USA
fDate :
7/1/2004 12:00:00 AM
Abstract :
A micromagnetic Monte Carlo simulation is developed to study the thermal decay and erasure process for perpendicular recording media. The switching probability is calculated based on both the energy barrier analysis and the master equation. The results show that for current head media combination at 1 Tb/in2, the erasure is severe for the neighboring tracks unless the bit-aspect ratio is increased. The magnetic write width for both side shielded (SS) and no side shield (NSS) head is about the same. The erase band for the SS write head is significantly smaller (20 nm less) than that for the NSS head, corresponding to 10 nm or 12% track pitch reduction.
Keywords :
Monte Carlo methods; magnetic heads; magnetic switching; micromagnetics; perpendicular magnetic recording; thermal stability; Monte Carlo simulation; bit-aspect ratio; energy barrier analysis; erase band; erasure process; head media; magnetic write width; master equation; micromagnetic simulation; no side shield head; perpendicular recording media; side shielded head; switching probability; thermal decay; tilted perpendicular recording; track edge effect; track pitch; Anisotropic magnetoresistance; Energy barrier; Equations; Magnetic analysis; Magnetic anisotropy; Magnetic heads; Micromagnetics; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Probability; Erasure; perpendicular recording; thermal decay; tilted perpendicular recording; track edge effect;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2004.832674