Title :
VIB-3 correlation between substrate and gate currents in MOSFETs
Author :
Ko, P.K. ; Hu, Chuanmin ; Muller, R.S.
fDate :
10/1/1981 12:00:00 AM
Keywords :
Current measurement; Integral equations; Laboratories; Length measurement; MOSFETs; Performance evaluation; Poisson equations; Reliability theory; Secondary generated hot electron injection; Silicon;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1981.20591
