Title :
VIB-6 measurement of submicron potential barriers in depleted base transistors
Author :
Stork, J.M.C. ; Plummer, James D.
fDate :
10/1/1981 12:00:00 AM
Keywords :
Computer simulation; Doping; Electric variables; Electric variables measurement; Geometry; Integrated circuit measurements; Laboratories; MOSFETs; Temperature measurement; Voltage control;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1981.20594
