DocumentCode
1076786
Title
A method for experimental assessment of the shifting approximation, with application to polysilicon solar cells
Author
Mazer, Jeffrey Alan ; Neugroschel, Arnost ; Lindholm, Fredrik A.
Author_Institution
Harris Semiconductor, Inc., Palm Bay, FL
Volume
28
Issue
12
fYear
1981
fDate
12/1/1981 12:00:00 AM
Firstpage
1530
Lastpage
1534
Abstract
A straightforward experimental method is developed for assessing the validity of the shifting approximation,
, for polysilicon and other polycrystalline solar cells. The method uses the fact that, in a solar cell for which the shifting approximation is valid, a constant series resistance, independent of illumination, will cause the light and dark
curves to be symmetrically displaced with respect to the
curve. This symmetry is discussed in detail. The experimental data suggest that the shifting approximation is valid and the series resistance is independent of illumination up to at least one-sun intensity for a variety of polysilicon solar cells in which the intragrain-base minority carrier diffusion length is smaller than or equal to the average grain diameter.
, for polysilicon and other polycrystalline solar cells. The method uses the fact that, in a solar cell for which the shifting approximation is valid, a constant series resistance, independent of illumination, will cause the light and dark
curves to be symmetrically displaced with respect to the
curve. This symmetry is discussed in detail. The experimental data suggest that the shifting approximation is valid and the series resistance is independent of illumination up to at least one-sun intensity for a variety of polysilicon solar cells in which the intragrain-base minority carrier diffusion length is smaller than or equal to the average grain diameter.Keywords
Dark current; Equivalent circuits; Hall effect; Helium; Lighting; Nonlinear optics; Photoconductivity; Photovoltaic cells; Radiative recombination; Solar power generation;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1981.20641
Filename
1481793
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