• DocumentCode
    1076828
  • Title

    A new theory of g-r and 1/f noise

  • Author

    Suh, Chung Ha

  • Author_Institution
    Hong-Ik University, Seoul, Korea
  • Volume
    28
  • Issue
    12
  • fYear
    1981
  • fDate
    12/1/1981 12:00:00 AM
  • Firstpage
    1555
  • Lastpage
    1557
  • Abstract
    A new unified formulation for generation-recombination (g-r) and 1/ f noise theory is attempted by introducing the total carrier number fluctuation mechanism via the trapping-detrapping processes between every discrete energy level in the conduction band and single degenerate traplevel without assuming the 1/τ distribution.
  • Keywords
    Area measurement; Circuit noise; Current density; Dark current; Lamps; Lighting; Photovoltaic cells; Silicon; Voltage measurement; Xenon;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1981.20646
  • Filename
    1481798
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1076828