DocumentCode :
1076860
Title :
An ADC test system based on the Macintosh computer
Author :
Gao, Z. ; Spiriti, E. ; Tortora, L.
Author_Institution :
Istituto Nazionale di Fisica Nucl., Rome, Italy
Volume :
41
Issue :
1
fYear :
1994
fDate :
2/1/1994 12:00:00 AM
Firstpage :
228
Lastpage :
231
Abstract :
An ADC test system based on UA1 Macintosh development system is described. The test system includes a CAMAC, 12 bit, 1 μs ADC module, an I/O Register, an HP pulse generator, a NIM dual timer and a GPIB programmable Keithley 237 high precision voltage source. The first test program was written in Fortran which gave the test results and histograms on the screen. A new Lab-VIEW 2 test program is also described. An upgrade of the test system and the CAMAC control to VME ADC is now in progress
Keywords :
Apple computers; CAMAC; analogue-digital conversion; automatic test equipment; detector circuits; microcomputer applications; nuclear electronics; pulse generators; ADC module; ADC test system; CAMAC; GPIB programmable Keithley 237 voltage source; I/O register; KLOE general purpose detector; Lab-VIEW 2 test program; Macintosh computer; NIM dual timer; pulse generator; CAMAC; Control systems; Histograms; Laboratories; Production facilities; Pulse generation; Registers; Structural beams; System testing; Voltage;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.281495
Filename :
281495
Link To Document :
بازگشت