• DocumentCode
    1076865
  • Title

    Quasistatic response of an MOS system to a constant gate-current bias

  • Author

    Allman, P.G.C. ; Simmons, J.G.

  • Author_Institution
    University of Durham, Durham, England
  • Volume
    2
  • Issue
    1
  • fYear
    1981
  • fDate
    1/1/1981 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    An experimental investigation is undertaken into the quasistatic response of an MOS system subjected to a constant gate-current bias. The self consistency of the method is demonstrated and it is shown that the inverse semiconductor capacitance can be extracted directly, in contrast to the slow-ramp quasistatic C-V measurement.
  • Keywords
    Capacitance measurement; Capacitance-voltage characteristics; Control systems; Current measurement; Feedback loop; MOS capacitors; MOS devices; Nitrogen; Operational amplifiers; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1981.25318
  • Filename
    1481802
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1076865