Title :
On the significance of scattered radiation in industrial X-ray computerized tomographic imaging
Author :
Leliveld, C.J. ; Maas, J.G. ; van Eijk, C.W.E. ; Bom, V.R.
Author_Institution :
Foundation for Fundamental Res. on Matter, Rijswijk, Netherlands
fDate :
2/1/1994 12:00:00 AM
Abstract :
We present Monte Carlo simulation results for industrial X-ray computerized tomographic imaging. We calculate the detected signal of all photons that were transmitted through a cylindrical object. Our simulations show that the signal contribution of the photons that were scattered is significant. The detected scattered signal is dominated by the single coherently scattered photons despite the small cross section for coherent interactions
Keywords :
Monte Carlo methods; X-ray scattering; computerised tomography; nondestructive testing; Monte Carlo simulation; coherently scattered photons; cylindrical object; industrial X-ray computerized tomographic imaging; scattered radiation; Computational modeling; Computer industry; Electromagnetic scattering; Object detection; Optical imaging; Particle scattering; Signal detection; Tomography; X-ray imaging; X-ray scattering;
Journal_Title :
Nuclear Science, IEEE Transactions on
