DocumentCode :
1077033
Title :
Strip-Line Methods for Dielectric Measurements at Microwave Frequencies
Author :
Olyphant, Murray, Jr. ; Ball, James H.
Author_Institution :
Dielectric Materials and Systems Laboratory, Minnesota Mining and Manufacturing Company, St. Paul, Minn.
Issue :
1
fYear :
1970
fDate :
3/1/1970 12:00:00 AM
Firstpage :
26
Lastpage :
32
Abstract :
Strip-line methods for measuring dielectric constants and loss tangent of sheet insulation, particularly of strip-line laminates, offer advantages for laboratory study and routine quality control of microwave dielectric properties at frequencies above 1 GHz. Theoretical and practical problems are discussed including possible strip circuit test patterns, effects of air gaps, correction for fringing field, adaptability to different dielectric thicknesses, and the relation of the measured loaded Q to both the unloaded Q of resonant strips and the dissipation factor of the dielectric period. Band-stop and band-pass filter test fixtures and measuring arrangements are described which are suitable for laboratory measurements or, when the filter circuit is made a permanent part of the fixture, for rapid and precise quality control testing. Dielectric properties measured at X-band (8-12 GHz) are given for a number of materials. Data are also included on the variability of copper-clad glass cloth-reinforced polytetrafluoroethylene (PTFE) and the dependence of apparent dielectric constant on clamping pressure and test temperature.
Keywords :
Band pass filters; Circuit testing; Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Laboratories; Microwave frequencies; Quality control; Strips;
fLanguage :
English
Journal_Title :
Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9367
Type :
jour
DOI :
10.1109/TEI.1970.299090
Filename :
4081582
Link To Document :
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