DocumentCode :
1077055
Title :
Low-Cost Characterization and Calibration of RF Integrated Circuits through I Q Data Ana
Author :
Acar, Erkan ; Ozev, Sule
Author_Institution :
Duke Univ., Durham, NC
Volume :
28
Issue :
7
fYear :
2009
fDate :
7/1/2009 12:00:00 AM
Firstpage :
993
Lastpage :
1005
Abstract :
Due to the increasing complexity of radio-frequency circuits, their testing becomes more challenging. A large number of performance parameters under several operation conditions are needed in order to ensure compliance to specifications. In this paper, we present a low-cost test methodology that determines significant performance parameters, such as path gain IIP 3, quadrature imbalances, noise, bit error rate, and error vector magnitude through a single test setup. The proposed test methodology is applicable for both single-carrier and multicarrier systems. Simulation and measurement results indicate that these performance parameters can be calculated and estimated accurately through a single test setup and using a shorter test sequence than required by traditional techniques. In addition, a calibration technique is presented for single-carrier systems to recover marginally failing devices through analytically correcting performance parameters.
Keywords :
calibration; data analysis; error statistics; integrated circuit noise; integrated circuit testing; mixed analogue-digital integrated circuits; modulators; power amplifiers; radio transmitters; radiofrequency amplifiers; radiofrequency integrated circuits; I-Q data analysis; I-Q modulator; RF integrated circuits; bit error rate; calibration; digital baseband circuit; error vector magnitude; low-cost test methodology; mixed-signal devices; multicarrier system; noise; path gain; power amplifier; quadrature imbalances; signal constellation analysis; single-carrier system; $I$ $Q$ calibration; WLAN testing; radio-frequency (RF) testing;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2009.2020718
Filename :
5075813
Link To Document :
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